The SEMple Imaging Competition with JEOL

The SEMple Imaging Competition

See your research at the nanoscale!

£100 1st place prize!

Deadline 28TH October

Have you ever wondered what Scanning Electron Microscopy (SEM) may give you that is different to optical microscopy? Or are you being pushed for higher magnifications and need a little help?…

As part of this year’s Scottish Microscopy Society symposium (25th November 2020), our industry sponsors JEOL are giving attendees the exciting opportunity to have their own research samples imaged on a state-of-the-art SEM! In addition to receiving high-quality SEM images of your sample which can be used for your own research purposes, JEOL are generously awarding the winning entry with a £100 cash prize, with £50 runner-up prizes also available!

The scanning electron microscope enables a clear observation of very small surface structures, which is not possible with an optical microscope. Moreover, as it can provide images with deeper focal depth, it enables observations of 3-dimensional images, with a similar sense as when we look at a substance with the naked-eye, by enlarging the specimen surface which has a rough structure (resolution is 0.5 to 4 nm).

This competition is open to those who register for the SMS symposium, where the winning images will be showcased by JEOL during their workshop session. Click here to enter the competition, where you will be asked to provide a short statement describing your proposed sample, and why it would benefit from SEM imaging. Click here for competition guidelines and advice regarding sample preparation.

The deadline for entries is the 28th October. Please be aware that if your sample is selected for imaging, it should be ready to send during the week starting 2nd November. 

Good luck, and we look forward to seeing striking SEM images of the winning samples at this year’s SMS Symposium!

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